4032铝合金铸锭偏析层厚度的检测方法

朱光磊; 长海博文; 李新涛; 纪黎

doi:10.15980/j.tzzz.2014.03.028

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4032铝合金铸锭偏析层厚度的检测方法
Measurement of Segregation Layer Thickness of 4032 Alloy Ingot
2014年34卷第3期页码：318-319
纸质出版日期： 2014 ，
DOI： 10.15980/j.tzzz.2014.03.028

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[1]朱光磊,长海博文,李新涛,纪黎.4032铝合金铸锭偏析层厚度的检测方法[J].特种铸造及有色合金,2014,34(03):318-319.

Zhu Guanglei, Hiromi Nagaumi, Li Xintao, et al. Measurement of Segregation Layer Thickness of 4032 Alloy Ingot[J]. Special Casting & Nonferrous Alloys, 2014,34(3):318-319.
[1]朱光磊,长海博文,李新涛,纪黎.4032铝合金铸锭偏析层厚度的检测方法[J].特种铸造及有色合金,2014,34(03):318-319. DOI： 10.15980/j.tzzz.2014.03.028.

Zhu Guanglei, Hiromi Nagaumi, Li Xintao, et al. Measurement of Segregation Layer Thickness of 4032 Alloy Ingot[J]. Special Casting & Nonferrous Alloys, 2014,34(3):318-319. DOI： 10.15980/j.tzzz.2014.03.028.

摘要

分别采用金相法、扫描电镜EDX能谱、光电直读光谱法测试4032铝合金铸锭表面偏析层厚度。结果发现

采用光电直读光谱法虽能准确检测出偏析层厚度

但检测过程繁琐且检测费用较高;而采用扫描电镜EDX法很难准确地检测出偏析层厚度;采用金相法能简单、快速地检测出偏析层厚度

铸锭表面到粗大α-Al树枝晶的距离即为偏析层厚度。

Abstract

Surface segregation layer thickness of 4032 alloy was examined by EDX spectroscopy

photoelectric direct reading spectrometer and metallographic method.The results show that photoelectric direct reading spectrometer can accurately detect the thickness of segregation layer.However

the process is cumbersome and expensive.It is difficult to accurately detect segregation layer by EDX analysis.Metallographic method can quickly and easily detect the thickness of segregation layer

which is the distance from the surface of ingots to coarse dendrite of ingot surface.

关键词

4032铝合金偏析层厚度EDX能谱光电直读光谱

Keywords

4032 AlloySegregation Layer ThicknessEDX AnalysisPhotoelectric Direct Reading Spectrometer

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