Effects of Annealing Temperature on Electric Resistance of Amorphous Cu50Zr42Al8 Alloy

Hu Yong; Kou Shengzhong; Xue Shuwei; Ding Yutian; Xu Guangji

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Effects of Annealing Temperature on Electric Resistance of Amorphous Cu₅₀Zr₄₂Al₈ Alloy
Issue 4, Pages: 250-252(2007)
Published： 2007 ，
DOI：

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[1]胡勇,寇生中,薛书微,丁雨田,许广济.退火对Cu_(50)Zr_(42)Al_8非晶合金电阻的影响[J].特种铸造及有色合金,2007(04):250-252+241.

Hu Yong, Kou Shengzhong, Xue Shuwei, et al. Effects of Annealing Temperature on Electric Resistance of Amorphous Cu₅₀Zr₄₂Al₈ Alloy. [J]. Special Casting & Nonferrous Alloys (4):250-252(2007)
[1]胡勇,寇生中,薛书微,丁雨田,许广济.退火对Cu_(50)Zr_(42)Al_8非晶合金电阻的影响[J].特种铸造及有色合金,2007(04):250-252+241. DOI：

Hu Yong, Kou Shengzhong, Xue Shuwei, et al. Effects of Annealing Temperature on Electric Resistance of Amorphous Cu₅₀Zr₄₂Al₈ Alloy. [J]. Special Casting & Nonferrous Alloys (4):250-252(2007) DOI：

摘要

采用惠更斯电桥法和X射线衍射技术测试了Cu50Zr42Al8块状非晶合金在不同温度（500

00℃）保温20min和550℃保温不同时间（10

0min）条件下的电阻值与结构变化。研究发现

Cu50Zr42Al8块状非晶合金的电阻值在接近晶化温度Tx的515

20℃温度区间附近增加得较快

呈现出电阻极大现象

且随着退火温度的升高和保温时间的延长

电阻值均呈现出先增大后减小的变化趋势。

Abstract

The variations in the electric resistance and structure of amorphous Cu50Zr42Al8 alloy annealed at different temperatures （500

00 ℃） for 20 minutes and at 550 ℃ for different time （10

0 min） have been measured by the Huygens electric bridge measurements and X-ray diffraction. It is found that the electric resistance of the bulk amorphous Cu50Zr42Al8 alloy is fast increased in the ranges of 515

20 ℃ near the crystallization temperature

exhibiting the maximum electric resistance phenomenon

furthermore

it is shown the trend of increasing initially and then decreasing with the increase of annealing temperature and holding time. The mechanism of above results is approached based on the structure changes resulting from order-atom clusters and phonon-electron scattering.