Han Lijuan1, Zhang Keke1, Wang Yaoli1, et al. Growth Behavior of Intermetallic Compounds(IMC) Between Sn-2.5Ag-0.7Cu-0.1RE and Cu Substrate During Aging. [J]. Special Casting & Nonferrous Alloys (11):895-897(2008)
Han Lijuan1, Zhang Keke1, Wang Yaoli1, et al. Growth Behavior of Intermetallic Compounds(IMC) Between Sn-2.5Ag-0.7Cu-0.1RE and Cu Substrate During Aging. [J]. Special Casting & Nonferrous Alloys (11):895-897(2008)DOI:
Growth Behavior of Intermetallic Compounds(IMC) Between Sn-2.5Ag-0.7Cu-0.1RE and Cu Substrate During Aging
Formation and growth of IMC in interface of Sn-2.5Ag-0.7Cu-0.1RE/Cu during aging were investigated by SEM(scanning electron microscope) and XRD(X-ray diffraction).The results reveal that lamellar Cu3Sn phase near by Cu side in the solder joint can be created with aging at 85 ℃
125 ℃ and 150 ℃.With extending aging time
formed Cu6Sn5 phase in the solder joint is converted from wave-like structure into scallop-like one with bigger size and then into lamellar one.The growth thickness of Cu6Sn5 phase and Cu3Sn phase are linearly proportional to the square root of aging time
which is controlled by diffusion mechanism.The activation energies are 81.7kJ/mol and 92.3kJ/mol
respectively.
关键词
Sn-2.5Ag-0.7Cu-0.1RE/Cu界面金属间化合物时效激活能
Keywords
Sn-2.5Ag-0.7Cu-0.1RE/Cu InterfaceIMCAgingActivation Energy